Calculating the number of Dies Per Wafer (DPW) is a very simple and straight forward task.Our free Die Per Wafer calculator is very simple to use
Enter Die Dimensions (width, height) as well as scribe lane values (horizontal and vertical). Depending on the wafer diameter and edge Loss area, the maximum number of Dies and wafer map will be automatically updated. User can select Map centering (Die or wafer centered). The number of Good Dies will be as well calculated, using Murphy’s Low model of Die Yield and Defect density parameter.